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4H-SiC (1)
4H–silicon carbide (1)
Alpha-particle irradiation (1)
Band gap states (1)
Deep level transient spectroscopy (DLTS) (1)
Deep levels (1)
Defects (1)
Detectors (1)
High energy electron (HEE) (1)
Irradiation (1)
Schottky contacts (1)
Schottky diodes (1)
Spectroscopy (1)