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Scanning electron microscopy (SEM) (7) |
Silicon carbide (SiC) (7) |
Rutherford backscattering spectrometry (RBS) (4) |
Annealing (2) |
Diffusion (2) |
Heavy ions (2) |
Irradiation (2) |
Radiation damage (2) |
Raman spectroscopy (2) |
Silicon compounds (2) |
Now showing items 1-10