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Scanning electron microscopy (SEM) (2) |
SiC (2) |
Annealing (1) |
Grazing incidence X-ray diffraction (GIXRD) (1) |
Interface (1) |
Ion bombardment (1) |
Microstructure (1) |
Nuclear materials (1) |
Reactions (1) |
Rutherford backscattering spectroscopy (RBS) (1) |
Now showing items 1-10