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Annealing (5)
Scanning electron microscopy (SEM) (5)
Rubidium (3)
Rutherford backscattering spectroscopy (RBS) (3)
Carbon substrates (2)
Glassy carbon (2)
Interface (2)
Reactions (2)
Rutherford backscattering spectrometry (RBS) (2)
Silicon carbide (SiC) (2)
Surface roughness (2)
Tungsten (W) (2)
A-carbon (1)
After-heat treatment (1)
Annealing temperatures (1)
Atomic compositions (1)
Carbon (1)
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Glass (1)
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Grazing incidence X-ray diffraction (GIXRD) (1)
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Iodine compounds (1)
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Irradiation (1)
Isochronal annealing (1)
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Polycrystalline SiC (1)
Raman spectroscopy (1)
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