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After-heat treatment (1)
Aluminum compounds (1)
Annealing (4)
Annealing temperatures (1)
Annealing time (AT) (1)
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Biaxial stress (1)
Bubbles (1)
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Carbon substrates (2)
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Citrate sol-gel method (1)
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Diffusion (2)
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Doping (additives) (1)
Effective band gap (1)
Elastic Recoil Detection Analysis (ERDA) (1)
Energy dispersive spectroscopy (1)
Energy dispersive x-ray spectroscopy (EDS) (1)
Energy gap (2)
Europium (Eu) (1)
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General applications (1)
Glass (1)
Glassy carbon (2)
Granulation (1)
Grazing incidence X-ray diffraction (GIXRD) (1)
Grazing incidence X-ray diffraction (GIXRD) (2)
Heat treatment (1)
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Homogeneous distribution (1)
Implantation (2)
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Interface (2)
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International Commission on Illumination (CIE) (1)
Ion bombardment (1)
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Nanotechnology (1)
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Raman spectroscopy (1)
RBS in a channelling mode (RBS-C) (1)
Reactions (2)
Rubidium (2)
Rutherford backscattering spectrometry (RBS) (1)
Rutherford backscattering spectrometry (RBS) (1)
Rutherford Backscattering Spectroscopy (RBS) (1)
Rutherford backscattering spectroscopy (RBS) (4)
Scanning electron microscopy (SEM) (12)
SEM micrographs (1)
Semiconductor quantum wells (1)
SiC (3)
SiC substrates (1)
Silicon carbide (SiC) (3)