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Scanning electron microscopy (SEM) (22)
Rutherford backscattering spectrometry (RBS) (8)
Raman spectroscopy (6)
Silicon carbide (SiC) (6)
Annealing (5)
Transmission electron microscopy (TEM) (5)
Luminescence (4)
Rutherford backscattering spectroscopy (RBS) (4)
SiC (4)
Swift heavy ion (SHI) (4)
X-ray diffraction (XRD) (4)
Diffusion (3)
Grazing incidence X-ray diffraction (GIXRD) (3)
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Rubidium (3)
Atomic force microscopy (AFM) (2)
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Energy dispersive x-ray spectroscopy (EDS) (2)
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Implantation (2)
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Citrate sol-gel method (1)
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Commission Internationale de I’Eclairage coordinates (CIE) (1)
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Elastic Recoil Detection Analysis (ERDA) (1)
Elastic recoil detection analysis (ERDA) (1)
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Helium (1)
Helium (He) (1)
High resolution transmission electron microscopy (HR-TEM) (1)
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Interfaces (materials) (1)