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Scanning electron microscopy (SEM) (2) |
X-ray diffraction (XRD) (2) |
Chemical bath deposition (CBD) (1) |
Deep level transient spectroscopy (DLTS) (1) |
Defects induced (1) |
Electrical properties (1) |
Electrically active defects (1) |
Electron microscopy (1) |
Interface states (1) |
Schottky barrier diodes (1) |
Now showing items 1-10