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Amorphization (1)
Atomic force microscopy (AFM) (1)
Cavities (1)
Helium (He) (1)
Raman spectroscopy (1)
Rutherford backscattering spectrometry (RBS) (1)
Scanning electron microscopy (SEM) (1)
SiC crystal structure (1)
Transmission electron microscopy (TEM) (1)