Now showing items 1-22
Irradiation (2) |
Scanning electron microscopy (SEM) (2) |
Swift heavy ion (SHI) (2) |
X-ray diffraction (XRD) (2) |
Biaxial stress (1) |
Crystallinities (1) |
Granulation (1) |
Heavy ions (1) |
Metal-silicon carbide (m-SiC) (1) |
Palladium (1) |
Phase identification (1) |
Radiation (1) |
Reaction (1) |
Rutherford backscattering spectrometry (RBS) (1) |
SiC substrates (1) |
Silicon carbide (SiC) (1) |
Silicon compounds (1) |
Small granules (1) |
Stress (1) |
Surface morphology (1) |
Thin film (1) |
Tungsten (1) |
Now showing items 1-22