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Deep level transient spectroscopy (DLTS) (1) |
Defects induced (1) |
Electrically active defects (1) |
Interface states (1) |
Scanning electron microscopy (SEM) (1) |
Schottky barrier diodes (1) |
Silicon carbide (SiC) (1) |
Solid state reactions (1) |
Temperature range (1) |
Thermal reactions (1) |
Tungsten carbide (1) |
Wide band gap semiconductors (1) |
X-ray diffraction (XRD) (1) |
Now showing items 1-13