Now showing items 1-10
Rutherford backscattering spectrometry (RBS) (8) |
Scanning electron microscopy (SEM) (8) |
Raman spectroscopy (5) |
Silicon carbide (SiC) (4) |
Swift heavy ion (SHI) (3) |
Transmission electron microscopy (TEM) (3) |
Annealing (2) |
Grazing incidence X-ray diffraction (GIXRD) (2) |
Irradiation (2) |
A-carbon (1) |
Now showing items 1-10