Now showing items 1-20
Rutherford backscattering spectrometry (RBS) (6) |
Scanning electron microscopy (SEM) (6) |
Silicon carbide (SiC) (4) |
Raman spectroscopy (3) |
Swift heavy ion (SHI) (3) |
Annealing (2) |
Irradiation (2) |
Transmission electron microscopy (TEM) (2) |
A-carbon (1) |
Carbon (1) |
Diffusion (1) |
Elastic recoil detection analysis (ERDA) (1) |
Free carbon (1) |
Grazing incidence X-ray diffraction (GIXRD) (1) |
Heavy ions (1) |
Interface (1) |
Iodine compounds (1) |
Irradiated samples (1) |
Metal-silicon carbide (m-SiC) (1) |
Polycrystalline (1) |
Now showing items 1-20