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Radiation damage (2) |
Scanning electron microscopy (SEM) (2) |
Silicon carbide (SiC) (2) |
Diffusion (1) |
Elastic recoil detection analysis (ERDA) (1) |
Europium (Eu) (1) |
Raman spectroscopy (1) |
RBS in a channelling mode (RBS-C) (1) |
Rutherford backscattering spectrometry (RBS) (1) |
Rutherford backscattering spectroscopy (RBS) (1) |
Now showing items 1-10