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Scanning electron microscopy (SEM) (4) |
Swift heavy ion (SHI) (4) |
Irradiation (3) |
Rutherford backscattering spectrometry (RBS) (3) |
Heavy ions (2) |
Silicon carbide (SiC) (2) |
Silicon compounds (2) |
X-ray diffraction (XRD) (2) |
A-carbon (1) |
Annealing (1) |
Now showing items 1-10