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Capacitance (1) |
Capacitance voltage measurements (1) |
Current voltage (1) |
Deep-level transient spectroscopy (DLTS) (1) |
Defects (1) |
Deposition (1) |
Depth profiling (1) |
Electrical characterization (1) |
Electrically active defects (1) |
Emission characteristics (1) |
Now showing items 1-10