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Diffusion (27)
Glassy carbon (6)
Ion implantation (6)
Rutherford backscattering spectrometry (RBS) (6)
Radiation damage (5)
Scanning electron microscopy (SEM) (5)
Silicon carbide (5)
Silicon carbide (SiC) (5)
Annealing (3)
Raman spectroscopy (3)
Rutherford backscattering spectroscopy (RBS) (3)
SHI irradiation (3)
Glassy carbon (GC) (2)
Indium (2)
Interfacial reaction (2)
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Polycrystalline SiC (2)
Raman (2)
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6H-SiC (1)
Ab initio (1)
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Anneal (1)
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Glassy Carbon (SIGRADURÒ) (1)
Grazing incidence X-ray diffraction (GIXRD) (1)
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Implantation (1)
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Implications (1)
In situ RBS (1)
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Laplace deep level transient spectroscopy (L-DLTS) (1)
Microstructural changes (1)
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Nickel (Ni) (1)
Pd (1)
Pebble bed modular reactor (PBMR) (1)
Polycrystalline (1)
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RBS in a channelling mode (RBS-C) (1)
Reactions (1)
Real-time Rutherford backscattering spectrometry (1)
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Rubidium (1)