Now showing items 1-10
Deep level transient spectroscopy (DLTS) (11) |
Defects (4) |
Defect (2) |
Electron beam exposure (EBE) (2) |
4H-SiC (1) |
4H–silicon carbide (1) |
Alpha particle irradiation (1) |
Alpha-particle irradiation (1) |
Atomic force microscopy (AFM) (1) |
Band edge (1) |
Now showing items 1-10