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Now showing items 1-10
| Deep level transient spectroscopy (DLTS) (1) |
| Defects induced (1) |
| Electrically active defects (1) |
| Interface states (1) |
| Scanning electron microscopy (SEM) (1) |
| Schottky barrier diodes (1) |
| Silicon carbide (SiC) (1) |
| Solid state reactions (1) |
| Temperature range (1) |
| Thermal reactions (1) |
Now showing items 1-10