Now showing items 1-8
Annealing (1) |
Barrier height (1) |
Capacitance–voltage (C–V) (1) |
Current–voltage (I–V) (1) |
Deep-level transient spectroscopy (DLTS) (1) |
EL2 defect (1) |
GaAs (1) |
Laplace deep-level transient spectroscopy (L-DLTS) (1) |
Now showing items 1-8