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Showing 10 out of a total of 63 results for community: Physics.
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In situ study of low-temperature irradiation-induced defects in silicon carbide
Tunhuma, Shandirai Malven
;
Auret, Francois Danie
;
Danga, Helga Tariro
;
Nel, Jacqueline Margot
;
Diale, M. (Mmantsae Moche)
(
Springer
,
2019-06
)
Response of Ni/4H-SiC Schottky barrier diodes to alpha-particle irradiation at different fluences
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Diale, M. (Mmantsae Moche)
;
Ngoepe, Phuti Ngako Mahloka
(
Elsevier
,
2016-01
)
Electrical characterization of defects induced by electron beam exposure in low doped n-GaAs
Tunhuma, Shandirai Malven
;
Auret, Francois Danie
;
Nel, Jacqueline Margot
;
Omotoso, Ezekiel
;
Danga, Helga Tariro
;
Igumbor, Emmanuel
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2017-10
)
Analysis of current voltage measurements on Au/Ni/n-GaN Schottky contacts in a wide temperature range
Mtangi, Wilbert
;
Janse van Rensburg, Pieter Johan
;
Diale, M. (Mmantsae Moche)
;
Auret, Francois Danie
;
Nyamhere, Cloud
;
Nel, Jacqueline Margot
;
Chawanda, Albert
(
Elsevier
,
2010-07
)
Ab initio studies of bimetallic-doped {0001} hematite surface for enhanced photoelectrochemical water splitting
Simfukwe, Joseph
;
Mapasha, Refilwe Edwin
;
Braun, Artur
;
Diale, M. (Mmantsae Moche)
(
MDPI
,
2021-08
)
Defects induced by solid state reactions at the tungsten-silicon carbide interface
Tunhuma, Shandirai Malven
;
Diale, M. (Mmantsae Moche)
;
Legodi, Matshisa Johannes
;
Nel, Jacqueline Margot
;
Thabethe, Thabsile Theodora
;
Auret, Francois Danie
(
American Institute of Physics Inc.
,
2018-01-18
)
Electrical characterisation of electron beam exposure induced defects in silicon
Danga, Helga Tariro
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2016-01
)
Electrical characterization of defects introduced during sputter deposition of tungsten on n type 4H-SiC
Tunhuma, Shandirai Malven
;
Auret, Francois Danie
;
Legodi, Matshisa Johannes
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2018-07
)
Chemical and electrical characteristics of annealed Ni/Au and Ni/Ir/Au contacts on AlGaN
Ngoepe, Phuti Ngako Mahloka
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Omotoso, Ezekiel
;
Diale, M. (Mmantsae Moche)
;
Swart, H.C.
;
Duvenhage, M.M.
;
Coetsee, E.
(
Elsevier
,
2016-01
)
Laplace current deep level transient spectroscopy measurements of defect states in methylammonium lead bromide single crystals
Rosenberg, John W.
;
Legodi, M.J. (Matshisa Johannes)
;
Rakita, Yevgeny
;
Cahen, David
;
Diale, M. (Mmantsae Moche)
(
American Institute of Physics
,
2017
)
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Author
Diale, M. (Mmantsae Moche) (63)
Auret, Francois Danie (36)
Nel, Jacqueline Margot (17)
Meyer, Walter Ernst (16)
Mtangi, Wilbert (11)
Omotoso, Ezekiel (11)
Chawanda, Albert (9)
Legodi, Matshisa Johannes (9)
Ngoepe, Phuti Ngako Mahloka (9)
Paradzah, Alexander Tapera (9)
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Deep level transient spectroscopy (DLTS) (11)
Annealing (8)
Defects (7)
Hematite (7)
Barrier height (6)
Deep-level transient spectroscopy (DLTS) (6)
Schottky contacts (6)
4H-SiC (4)
AlGaN (4)
Diodes, Schottky-barrier (4)
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2020 - 2024 (15)
2010 - 2019 (46)
2009 - 2009 (2)
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