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Comparative study of the electrical properties of Pd/ZnO Schottky contacts fabricated using electron beam deposition and resistive/thermal evaporation techniques
Mtangi, Wilbert
;
Auret, Francois Danie
;
Janse van Rensburg, Pieter Johan
;
Coelho, Sergio M.M.
;
Legodi, Matshisa Johannes
;
Meyer, Walter Ernst
;
Chawanda, Albert
(
American Institute of Physics
,
2011-11
)
Defect production in strained p-type Si1-xGex by Er implantation
Mamor, M.
;
Pipeleers, B.
;
Auret, Francois Danie
;
Vantomme, M.
(
American Institute of Physics
,
2011-01
)
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Author
Auret, Francois Danie (2)
Chawanda, Albert (1)
Coelho, Sergio M.M. (1)
Janse van Rensburg, Pieter Johan (1)
Legodi, Matshisa Johannes (1)
Mamor, M. (1)
Meyer, Walter Ernst (1)
Mtangi, Wilbert (1)
Pipeleers, B. (1)
Vantomme, M. (1)
Subject
Deep level transient spectroscopy (2)
Electron beam deposition (2)
Electron beams (2)
Alpha rays (1)
Alpha-particle effects (1)
Annealing (1)
Compressibility (1)
Crystal defects (1)
Electron beam effects (1)
Ge-Si alloys (1)
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2011 (2)
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