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Showing 6 out of a total of 6 results for community: Physics.
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Comparative study of the electrical properties of Pd/ZnO Schottky contacts fabricated using electron beam deposition and resistive/thermal evaporation techniques
Mtangi, Wilbert
;
Auret, Francois Danie
;
Janse van Rensburg, Pieter Johan
;
Coelho, Sergio M.M.
;
Legodi, Matshisa Johannes
;
Meyer, Walter Ernst
;
Chawanda, Albert
(
American Institute of Physics
,
2011-11
)
Deep level transient spectroscopy (DLTS) study of defects introduced in antimony doped Ge by 2 MeV proton irradiation
Nyamhere, Cloud
;
Das, A.G.M.
;
Auret, Francois Danie
;
Chawanda, Albert
;
Pineda-Vargas, C.A.
;
Venter, Andre
(
Elsevier
,
2011-08
)
Electrical characterization of metastable defects introduced in GaN by eu-ion implantation
Auret, Francois Danie
;
Meyer, Walter Ernst
;
Diale, M. (Mmantsae Moche)
;
Janse van Rensburg, Pieter Johan
;
Song, S.F.
;
Temst, K.
;
Vantomme, A.
(
Trans Tech
,
2011-03
)
Defect production in strained p-type Si1-xGex by Er implantation
Mamor, M.
;
Pipeleers, B.
;
Auret, Francois Danie
;
Vantomme, M.
(
American Institute of Physics
,
2011-01
)
Determination of the laterally homogeneous barrier height of palladium Schottky barrier diodes on n-Ge (1 1 1)
Chawanda, Albert
;
Roro, K.T.
;
Auret, Francois Danie
;
Mtangi, Wilbert
;
Nyamhere, Cloud
;
Nel, Jacqueline Margot
;
Leach, Lindsay Josephine
(
Elsevier
,
2011
)
Kalibrering van 'n opto-elektroniese stelsel vir die karakterisering van ultraviolet-sensitiewe fotodiodes
Van Schalkwyk, Louwrens
;
Meyer, Walter Ernst
;
Nel, Jacqueline Margot
;
Auret, Francois Danie
(
Suid Afrikaanse Akademie vir Wetenskap & Kuns
,
2011
)
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Auret, Francois Danie (6)
Chawanda, Albert (3)
Meyer, Walter Ernst (3)
Janse van Rensburg, Pieter Johan (2)
Mtangi, Wilbert (2)
Nel, Jacqueline Margot (2)
Nyamhere, Cloud (2)
Coelho, Sergio M.M. (1)
Das, A.G.M. (1)
Diale, M. (Mmantsae Moche) (1)
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Deep level transient spectroscopy (3)
Electron beam deposition (2)
Electron beams (2)
Ion implantation (2)
Alpha rays (1)
Alpha-particle effects (1)
Annealing (1)
Barrier height (1)
Calibration (1)
Compressibility (1)
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Date Issued
2011 (6)
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