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Defects induced by solid state reactions at the tungsten-silicon carbide interface
Tunhuma, Shandirai Malven
;
Diale, M. (Mmantsae Moche)
;
Legodi, Matshisa Johannes
;
Nel, Jacqueline Margot
;
Thabethe, Thabsile Theodora
;
Auret, Francois Danie
(
American Institute of Physics Inc.
,
2018-01-18
)
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Author
Auret, Francois Danie (1)
Diale, M. (Mmantsae Moche) (1)
Legodi, Matshisa Johannes (1)
Nel, Jacqueline Margot (1)
Thabethe, Thabsile Theodora (1)
Tunhuma, Shandirai Malven (1)
Subject
Deep level transient spectroscopy (DLTS) (1)
Defects induced (1)
Electrically active defects (1)
Interface states (1)
Scanning electron microscopy (SEM) (1)
Schottky barrier diodes (1)
Silicon carbide (SiC) (1)
Solid state reactions (1)
Temperature range (1)
Thermal reactions (1)
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Date Issued
2018 (1)
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