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Electrical characterization of process, annealing and irradiation induced defects in ZnO
Unknown author
(
University of Pretoria
,
2013-04-24
)
Electrical characterization of defects introduced during electron beam deposition of W Schottky contacts on n-type 4H-SiC
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Coelho, Sergio M.M.
;
Diale, M. (Mmantsae Moche)
;
Ngoepe, Phuti Ngako Mahloka
;
Auret, Francois Danie
(
Elsevier
,
2016-08
)
Electronic and annealing properties of the E0.31 defect introduced during Ar plasma etching of germanium
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Myburg, G.
;
Janse van Rensburg, Pieter Johan
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
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Author
Auret, Francois Danie (2)
Coelho, Sergio M.M. (2)
Meyer, Walter Ernst (2)
Diale, M. (Mmantsae Moche) (1)
Janse van Rensburg, Pieter Johan (1)
Myburg, G. (1)
Ngoepe, Phuti Ngako Mahloka (1)
Omotoso, Ezekiel (1)
Subject
Annealing (3)
Defects (3)
4H-SiC (1)
Activation enthalpy (1)
Ar plasma etching (1)
Arrhenius plots (1)
Capture cross-section (1)
Cv (1)
Deep level defects (1)
Deep level transient spectroscopy (1)
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2009 (1)
2013 (1)
2016 (1)
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