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Electrical characterization of deep levels created by bombarding nitrogen-doped 4HSiC with alpha-particle irradiation
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Paradzah, Alexander Tapera
;
Legodi, Matshisa Johannes
(
Elsevier
,
2016-03
)
Deep level transient spectroscopy (DLTS) study of defects introduced in antimony doped Ge by 2 MeV proton irradiation
Nyamhere, Cloud
;
Das, A.G.M.
;
Auret, Francois Danie
;
Chawanda, Albert
;
Pineda-Vargas, C.A.
;
Venter, Andre
(
Elsevier
,
2011-08
)
Electrical characterisation of electron beam exposure induced defects in silicon
Danga, Helga Tariro
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2016-01
)
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Author
Auret, Francois Danie (3)
Chawanda, Albert (1)
Coelho, Sergio M.M. (1)
Danga, Helga Tariro (1)
Das, A.G.M. (1)
Diale, M. (Mmantsae Moche) (1)
Legodi, Matshisa Johannes (1)
Meyer, Walter Ernst (1)
Nyamhere, Cloud (1)
Omotoso, Ezekiel (1)
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Subject
Laplace-DLTS (3)
4H-SiC (1)
Alpha-particle irradiation (1)
Annealing (1)
Deep level transient spectroscopy (1)
Deep level transient spectroscopy (DLTS) (1)
Deep-level transient spectroscopy (DLTS) (1)
Electron beam exposure (EBE) (1)
Electron irradiation (1)
Ge (1)
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Date Issued
2016 (2)
2011 (1)
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