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Showing 6 out of a total of 36 results for community: Physics.
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Effects of high temperature annealing on single crystal ZnO and ZnO devices
Mtangi, Wilbert
;
Auret, Francois Danie
;
Diale, M. (Mmantsae Moche)
;
Meyer, Walter Ernst
;
Chwanda, Albert
;
De Meyer, Hannes
;
Janse van Rensburg, Pieter Johan
;
Nel, Jacqueline Margot
(
American Institute of Physics
,
2012-04-16
)
Effects of hydrogen, oxygen, and argon annealing on the electrical properties of ZnO and ZnO devices studied by current-voltage, deep level transient spectroscopy, and Laplace DLTS
Mtangi, Wilbert
;
Auret, Francois Danie
;
Diale, M. (Mmantsae Moche)
;
Coelho, Sergio M.M.
;
Legodi, Matshisa Johannes
;
Janse van Rensburg, Pieter Johan
;
Nel, Jacqueline Margot
(
American Institute of Physics
,
2012-05-03
)
Electrical characterization of 5.4 MeV alpha-particle irradiated 4H-SiC with low doping density
Paradzah, Alexander Tapera
;
Auret, Francois Danie
;
Legodi, Matshisa Johannes
;
Omotoso, Ezekiel
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2015-09
)
Electrical characterisation of electron beam exposure induced defects in silicon
Danga, Helga Tariro
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2016-01
)
Correlation between barrier heights and ideality factors of Ni/n-Ge (100) schottky barrier diodes
Chawanda, Albert
;
Nel, Jacqueline Margot
;
Auret, Francois Danie
;
Mtangi, Wilbert
;
Nyamhere, Cloud
;
Diale, M. (Mmantsae Moche)
;
Leach, Lindsay Josephine
(
Korean Physical Society
,
2010-12
)
Effects of 5.4 MeV alpha-particle irradiation on the electrical properties of nickel Schottky diodes on 4H-SiC
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Paradzah, Alexander Tapera
;
Diale, M. (Mmantsae Moche)
;
Coelho, Sergio M.M.
;
Janse van Rensburg, Pieter Johan
;
Ngoepe, Phuti Ngako Mahloka
(
Elsevier
,
2015-12
)
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Auret, Francois Danie (36)
Diale, M. (Mmantsae Moche) (36)
Meyer, Walter Ernst (16)
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Mtangi, Wilbert (11)
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Janse van Rensburg, Pieter Johan (8)
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Deep level transient spectroscopy (DLTS) (10)
Annealing (7)
Barrier height (6)
Deep-level transient spectroscopy (DLTS) (6)
Defects (6)
Schottky contacts (6)
4H-SiC (4)
AlGaN (4)
Diodes, Schottky-barrier (4)
Deep level transient spectroscopy (3)
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