Halindintwali, S.; Khoele, J.; Nemroaui, O.; Comrie, C.M.; Theron, C.C. (Chris)
(Elsevier, 2015-04)
Hydrogen effusion from hydrogenated amorphous silicon (a-Si:H) and amorphous silicon carbide
(a-Si1 xCx:H) thin films during a temperature ramp between RT and 600 C was studied by in situ realtime
elastic recoil detection ...