Wendler, E.; Bierschenk, Th.; Felgentrager, F.; Sommerfeld, J.; Wesch, W.; Alber, D.; Bukalis, G.; Prinsloo, Linda Charlotta; Van der Berg, Nic (Nicolaas George); Friedland, Erich Karl Helmuth; Malherbe, Johan B.
(Elsevier, 2012-09)
The defect formation in neutron irradiated SiC was investigated by means of Rutherford backscattering
spectrometry in channelling mode (RBS), optical absorption and Raman spectroscopy. The relative defect
concentration ...
