Mtangi, Wilbert; Auret, Francois Danie; Chawanda, Albert; Jansen van Rensburg, P. J.; Coelho, Sergio M.M.; Nel, J.M.; Diale, M. (Mmantsae Moche); Van Schalkwyk, Louwrens; Nyamhere, Cloud
(Elsevier, 2012-10)
Current–voltage (IV) and capacitance–voltage (CV) measurement techniques have successfully been
employed to study the effects of annealing highly rectifying Pd/ZnO Schottky contacts. IV results reveal
a decrease in the ...