Influence of growth morphology on the Neel temperature of CrRu thin films and heterostructures

Show simple item record Prinsloo, A.R.E. Derrett, H.A. Hellwig, O. Fullerton, E.E. Alberts, H.L. Van den Berg, N.G. 2009-10-26T12:09:18Z 2009-10-26T12:09:18Z 2009
dc.description.abstract Dimensionality effects on epitaxial and polycrystalline Cr1-xRux alloy thin films and in Cr/Cr–Ru heterostructures are reported. X-ray analysis on Cr0.9965Ru0.0035 epitaxial films indicates an increase in the coherence length in growth directions(100) and (110) with increasing thickness(d), in the range 20≤d≤300nm. Atomic force microscopy studies on these films show pronounced vertical growth for d>50nm, resulting in the formation of columnar structures. The Néel temperatures (TN) of the Cr0.9965Ru0.0035 films show anomalous behaviour as a function of d at thickness d≈50 nm. It is interesting to note that this thickness corresponds to that for which a change in film morphology occurs. Experiments on epitaxial Cr1-xRux thin films, with 0≤x≤0.013 and d = 50 nm, give TN–x curves that correspond well with that of bulk Cr1-xRux alloys. Studies on Cr/Cr0.9965Ru0.0035 superlattices prepared on MgO (100), with the Cr layer thickness varied between 10 and 50nm, keeping the Cr0.9965Ru0.0035 thickness constantat 10nm, indicate a sharp decrease in TN as the Cr separation layers reaches a thickness of 30nm; ascribed to spin density wave pinning in the Cr layers for d< 30nm by the adjacent CrRu layers. en_US
dc.identifier.citation A.R.E.Prinsloo,et al.,J.Magn.Magn.Mater.(2009),doi:10.1016/j.jmmm.2009.07.063 en_US
dc.identifier.issn 0304-8853
dc.identifier.other 10.1016/j.jmmm.2009.07.063
dc.language.iso en en_US
dc.publisher Elsevier en_US
dc.rights Elsevier en_US
dc.subject Cr alloy en
dc.subject Epitaxial thin film en
dc.subject Spin density wave en
dc.subject Electrical resistivity en
dc.subject Neel temperature en
dc.subject CrRu thin films en
dc.subject.lcsh Epitaxy en
dc.subject.lcsh Heterostructures en
dc.title Influence of growth morphology on the Neel temperature of CrRu thin films and heterostructures en_US
dc.type Postprint Article en_US

Files in this item

This item appears in the following Collection(s)

Show simple item record