dc.contributor.author |
Prinsloo, A.R.E.
|
|
dc.contributor.author |
Derrett, H.A.
|
|
dc.contributor.author |
Hellwig, O.
|
|
dc.contributor.author |
Fullerton, E.E.
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|
dc.contributor.author |
Alberts, H.L.
|
|
dc.contributor.author |
Van den Berg, N.G.
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|
dc.date.accessioned |
2009-10-26T12:09:18Z |
|
dc.date.available |
2009-10-26T12:09:18Z |
|
dc.date.issued |
2009 |
|
dc.description.abstract |
Dimensionality effects on epitaxial and polycrystalline Cr1-xRux alloy thin films and in Cr/Cr–Ru heterostructures are reported. X-ray analysis on Cr0.9965Ru0.0035 epitaxial films indicates an increase in the coherence length in growth directions(100) and (110) with increasing thickness(d), in the range 20≤d≤300nm. Atomic force microscopy studies on these films show pronounced vertical growth for d>50nm, resulting in the formation of columnar structures. The Néel temperatures (TN) of the Cr0.9965Ru0.0035 films show anomalous behaviour as a function of d at thickness d≈50 nm. It is interesting to note that this thickness corresponds to that for which a change in film morphology occurs. Experiments on epitaxial Cr1-xRux thin films, with 0≤x≤0.013 and d = 50 nm, give TN–x curves that correspond well with that of bulk Cr1-xRux alloys. Studies on Cr/Cr0.9965Ru0.0035 superlattices prepared on MgO (100), with the Cr layer thickness varied between 10 and 50nm, keeping the Cr0.9965Ru0.0035 thickness constantat 10nm, indicate a sharp decrease in TN as the Cr separation layers reaches a thickness of 30nm; ascribed to spin density wave pinning in the Cr layers for d< 30nm by the adjacent CrRu layers. |
en_US |
dc.identifier.citation |
A.R.E.Prinsloo,et al.,J.Magn.Magn.Mater.(2009),doi:10.1016/j.jmmm.2009.07.063 |
en_US |
dc.identifier.issn |
0304-8853 |
|
dc.identifier.other |
10.1016/j.jmmm.2009.07.063 |
|
dc.identifier.uri |
http://hdl.handle.net/2263/11559 |
|
dc.language.iso |
en |
en_US |
dc.publisher |
Elsevier |
en_US |
dc.rights |
Elsevier |
en_US |
dc.subject |
Cr alloy |
en |
dc.subject |
Epitaxial thin film |
en |
dc.subject |
Spin density wave |
en |
dc.subject |
Electrical resistivity |
en |
dc.subject |
Neel temperature |
en |
dc.subject |
CrRu thin films |
en |
dc.subject.lcsh |
Epitaxy |
en |
dc.subject.lcsh |
Heterostructures |
en |
dc.title |
Influence of growth morphology on the Neel temperature of CrRu thin films and heterostructures |
en_US |
dc.type |
Postprint Article |
en_US |