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dc.contributor.author | Prinsloo, A.R.E.![]() |
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dc.contributor.author | Derrett, H.A.![]() |
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dc.contributor.author | Hellwig, O.![]() |
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dc.contributor.author | Fullerton, E.E.![]() |
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dc.contributor.author | Alberts, H.L.![]() |
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dc.contributor.author | Van den Berg, N.G.![]() |
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dc.date.accessioned | 2009-10-26T12:09:18Z | |
dc.date.available | 2009-10-26T12:09:18Z | |
dc.date.issued | 2009 | |
dc.description.abstract | Dimensionality effects on epitaxial and polycrystalline Cr1-xRux alloy thin films and in Cr/Cr–Ru heterostructures are reported. X-ray analysis on Cr0.9965Ru0.0035 epitaxial films indicates an increase in the coherence length in growth directions(100) and (110) with increasing thickness(d), in the range 20≤d≤300nm. Atomic force microscopy studies on these films show pronounced vertical growth for d>50nm, resulting in the formation of columnar structures. The Néel temperatures (TN) of the Cr0.9965Ru0.0035 films show anomalous behaviour as a function of d at thickness d≈50 nm. It is interesting to note that this thickness corresponds to that for which a change in film morphology occurs. Experiments on epitaxial Cr1-xRux thin films, with 0≤x≤0.013 and d = 50 nm, give TN–x curves that correspond well with that of bulk Cr1-xRux alloys. Studies on Cr/Cr0.9965Ru0.0035 superlattices prepared on MgO (100), with the Cr layer thickness varied between 10 and 50nm, keeping the Cr0.9965Ru0.0035 thickness constantat 10nm, indicate a sharp decrease in TN as the Cr separation layers reaches a thickness of 30nm; ascribed to spin density wave pinning in the Cr layers for d< 30nm by the adjacent CrRu layers. | en_US |
dc.identifier.citation | A.R.E.Prinsloo,et al.,J.Magn.Magn.Mater.(2009),doi:10.1016/j.jmmm.2009.07.063 | en_US |
dc.identifier.issn | 0304-8853 | |
dc.identifier.other | 10.1016/j.jmmm.2009.07.063 | |
dc.identifier.uri | http://hdl.handle.net/2263/11559 | |
dc.language.iso | en | en_US |
dc.publisher | Elsevier | en_US |
dc.rights | Elsevier | en_US |
dc.subject | Cr alloy | en |
dc.subject | Epitaxial thin film | en |
dc.subject | Spin density wave | en |
dc.subject | Electrical resistivity | en |
dc.subject | Neel temperature | en |
dc.subject | CrRu thin films | en |
dc.subject.lcsh | Epitaxy | en |
dc.subject.lcsh | Heterostructures | en |
dc.title | Influence of growth morphology on the Neel temperature of CrRu thin films and heterostructures | en_US |
dc.type | Postprint Article | en_US |