Snyman, Lukas Willem; Du Plessis, Monuko; Bellotti, Enrico
(Institute of Electrical and Electronics Engineers, 2010-06)
p+ np+ CMOS Si LED structures were modeled in order to investigate the effect of various depletion layer profiles and defect engineering on the photonic transitions in the 1.4–2.8 eV, 450–750 nm regime. Modeling shows that ...