Omotoso, Ezekiel; Meyer, Walter Ernst; Coelho, Sergio M.M.; Diale, M. (Mmantsae Moche); Ngoepe, Phuti Ngako Mahloka; Auret, Francois Danie
(Elsevier, 2016-08)
We have studied the defects introduced in n-type 4H-SiC during electron beam deposition
(EBD) of tungsten by deep-level transient spectroscopy (DLTS). The results from currentvoltage
and capacitance-voltage measurements ...