dc.contributor.author |
Magagula, Zwelakhe
|
|
dc.contributor.author |
Malela‑Majika, Jean‑Claude
|
|
dc.contributor.author |
Human, Schalk William
|
|
dc.contributor.author |
Castagliola, Philippe
|
|
dc.contributor.author |
Chatterjee, Kashinath
|
|
dc.contributor.author |
Koukouvinos, Christos
|
|
dc.date.accessioned |
2024-12-10T05:24:40Z |
|
dc.date.available |
2024-12-10T05:24:40Z |
|
dc.date.issued |
2024 |
|
dc.description.abstract |
A significant challenge in statistical process monitoring (SPM) is to find exact and
closed-form expressions (CFEs) (i.e. formed with constants, variables and a finite
set of essential functions connected by arithmetic operations and function composition) for the run-length properties such as the average run-length (ARL), the standard deviation of the run-length (SDRL), and the percentiles of the run-length (PRL)
of nonparametric monitoring schemes. Most of the properties of these schemes are
usually evaluated using simulation techniques. Although simulation techniques are
helpful when the expression for the run-length is complicated, their shortfall is that
they require a high number of replications to reach reasonably accurate answers.
Consequently, they take too much computational time compared to other methods,
such as the Markov chain method or integration techniques, and even with many
replications, the results are always affected by simulation error and may result in
an inaccurate estimation. In this paper, closed-form expressions of the run-length
properties for the nonparametric double sampling precedence monitoring scheme
are derived and used to evaluate its ability to detect shifts in the location parameter.
The computational times of the run-length properties for the CFE and the simulation approach are compared under different scenarios. It is found that the proposed
approach requires less computational time compared to the simulation approach.
Moreover, once derived, CFEs have the added advantage of ease of implementation, cutting of on complex convergence techniques. CFE’s can also easily be built
into mathematical software for ease of computation and may be recalled for further
work. |
en_US |
dc.description.department |
Statistics |
en_US |
dc.description.sdg |
SDG-04:Quality Education |
en_US |
dc.description.sdg |
SDG-09: Industry, innovation and infrastructure |
en_US |
dc.description.sponsorship |
The University of Pretoria. |
en_US |
dc.description.uri |
https://www.springer.com/journal/180 |
en_US |
dc.identifier.citation |
Magagula, Z., Malela-Majika, JC., Human, S.W. et al. Closed-form expressions of the run-length distribution of the nonparametric double sampling precedence monitoring scheme. Computational Statistics (2024). https://doi.org/10.1007/s00180-024-01488-z. |
en_US |
dc.identifier.issn |
0943-4062 (print) |
|
dc.identifier.issn |
1613-9658 (online) |
|
dc.identifier.other |
10.1007/s00180-024-01488-z |
|
dc.identifier.uri |
http://hdl.handle.net/2263/99832 |
|
dc.language.iso |
en |
en_US |
dc.publisher |
Springer |
en_US |
dc.rights |
© The Author(s) 2024. Open Access. This article is licensed under a Creative Commons Attribution 4.0 International License. |
en_US |
dc.subject |
Shewhart |
en_US |
dc.subject |
Control chart |
en_US |
dc.subject |
Order statistic |
en_US |
dc.subject |
Distribution-free |
en_US |
dc.subject |
Precedence |
en_US |
dc.subject |
Exact run-length distribution |
en_US |
dc.subject |
Performance analysis |
en_US |
dc.subject |
SDG-04: Quality education |
en_US |
dc.subject |
SDG-09: Industry, innovation and infrastructure |
en_US |
dc.subject |
Statistical process monitoring (SPM) |
en_US |
dc.subject |
Closed-form expression (CFE) |
en_US |
dc.subject |
Average run-length (ARL) |
en_US |
dc.subject |
Nonparametric monitoring schemes |
en_US |
dc.subject |
Percentiles of the run-length (PRL) |
en_US |
dc.subject |
Standard deviation of the run-length (SDRL) |
en_US |
dc.title |
Closed-form expressions of the run-length distribution of the nonparametric double sampling precedence monitoring scheme |
en_US |
dc.type |
Article |
en_US |