Influence of PVT variation and threshold selection on OBT and OBIST fault detection in RFCMOS amplifiers
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| dc.contributor.author | Nel, Hendrik P.
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| dc.contributor.author | Dualibe, Fortunato Carlos
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| dc.contributor.author | Stander, Tinus
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| dc.date.accessioned | 2024-04-15T08:51:33Z | |
| dc.date.available | 2024-04-15T08:51:33Z | |
| dc.date.issued | 2023 | |
| dc.description.abstract | Please read abstract in the article. | en_US |
| dc.description.department | Electrical, Electronic and Computer Engineering | en_US |
| dc.description.librarian | hj2024 | en_US |
| dc.description.sdg | SDG-09: Industry, innovation and infrastructure | en_US |
| dc.description.sponsorship | The NRF/F.RS.-FNRS South Africa–Wallonia Joint Science and Technology Research Collaboration. | en_US |
| dc.description.uri | https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=8784029 | en_US |
| dc.identifier.citation | H.P. Nel, F.C. Dualibe and T. Stander, "Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers," in IEEE Open Journal of Circuits and Systems, vol. 4, pp. 70-84, 2023, doi: 10.1109/OJCAS.2022.3232638. | en_US |
| dc.identifier.issn | 2644-1225 (online) | |
| dc.identifier.other | 10.1109/OJCAS.2022.3232638 | |
| dc.identifier.uri | http://hdl.handle.net/2263/95512 | |
| dc.language.iso | en | en_US |
| dc.publisher | Institute of Electrical and Electronics Engineers | en_US |
| dc.rights | This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License. | en_US |
| dc.subject | Oscillation-based testing (OBT) | en_US |
| dc.subject | Oscillation-based built-in self-testing (OBIST) | en_US |
| dc.subject | Circuit faults | en_US |
| dc.subject | Integrated circuit modeling | en_US |
| dc.subject | Built-in self-test | en_US |
| dc.subject | Circuit simulation | en_US |
| dc.subject | Process, voltage and temperature (PVT) | en_US |
| dc.subject | CMOS technology | en_US |
| dc.subject | Complementary metal-oxide semiconductor (CMOS) | en_US |
| dc.subject | Design for testability | en_US |
| dc.subject | Microwave integrated circuits | en_US |
| dc.subject | Fault detection | en_US |
| dc.subject | Circuit simulation | en_US |
| dc.subject | Design for testability | en_US |
| dc.subject | Low-noise amplifier (LNA) | en_US |
| dc.subject | SDG-09: Industry, innovation and infrastructure | en_US |
| dc.title | Influence of PVT variation and threshold selection on OBT and OBIST fault detection in RFCMOS amplifiers | en_US |
| dc.type | Article | en_US |
