Effects of implantation temperature and annealing on structural evolution and migration of Se into glassy carbon

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dc.contributor.author Adeojo, Samuel Adedigba
dc.contributor.author Malherbe, Johan B.
dc.contributor.author Azarov, Alexander
dc.contributor.author Odutemowo, Opeyemi Shakirah
dc.contributor.author Njoroge, Eric Gitau
dc.contributor.author Abdelbagi, Hesham Abdelbagi Ali
dc.contributor.author Mpelane, Siyasanga
dc.contributor.author Hlatshwayo, Thulani Thokozani
dc.date.accessioned 2023-07-11T13:09:33Z
dc.date.available 2023-07-11T13:09:33Z
dc.date.issued 2022-07
dc.description.abstract Please read abstract in the article. en_US
dc.description.department Physics en_US
dc.description.librarian hj2023 en_US
dc.description.sponsorship The AST&D scholarship from the Tertiary Education Trust Fund (TETFund), Nigeria, and the Postgraduate Bursary from the University of Pretoria, South Africa. en_US
dc.description.uri http://www.elsevier.com/locate/ssscie en_US
dc.identifier.citation Adeojo, S., Malherbe, J., Azarov, A., et al. 2022, 'Effects of implantation temperature and annealing on structural evolution and migration of Se into glassy carbon', Solid State Sciences, vol. 129, art. 106914, pp. 1-10, doi : 10.1016/j.solidstatesciences.2022.106914. en_US
dc.identifier.issn 1293-2558 (print)
dc.identifier.issn 1873-3085 (online)
dc.identifier.other 10.1016/j.solidstatesciences.2022.106914
dc.identifier.uri http://hdl.handle.net/2263/91348
dc.language.iso en en_US
dc.publisher Elsevier en_US
dc.rights © 2022 Elsevier Masson SAS. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Solid State Sciences. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Solid State Sciences, vol. 129, art. 106914, pp. 1-10, doi : 10.1016/j.solidstatesciences.2022.106914. en_US
dc.subject Transmission electron microscopy (TEM) en_US
dc.subject Secondary ion mass spectrometry (SIMS) en_US
dc.subject Raman spectroscopy en_US
dc.subject Implantation defect en_US
dc.subject Trapping en_US
dc.subject De-trapping en_US
dc.title Effects of implantation temperature and annealing on structural evolution and migration of Se into glassy carbon en_US
dc.type Postprint Article en_US


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