The effects of 167 MeV Xe26+ swift heavy ions irradiation on chemical vapour deposited silicon carbide
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| dc.contributor.author | Thabethe, Thabsile Theodora
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| dc.contributor.author | Adeojo, Samuel Adedigba
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| dc.contributor.author | Mirzayeva, M.N.
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| dc.contributor.author | Skuratov, V.A.
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| dc.contributor.author | Njoroge, Eric Gitau
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| dc.contributor.author | Odutemowo, Opeyemi Shakirah
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| dc.contributor.author | Hlatshwayo, Thulani Thokozani
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| dc.date.accessioned | 2023-01-26T06:52:07Z | |
| dc.date.issued | 2022-09 | |
| dc.description.abstract | Please read abstract in the article. | en_US |
| dc.description.department | Physics | en_US |
| dc.description.embargo | 2024-08-17 | |
| dc.description.librarian | hj2023 | en_US |
| dc.description.sponsorship | The National Research Foundation (NRF) of South Africa. | en_US |
| dc.description.uri | http://www.elsevier.com/locate/nimb | en_US |
| dc.identifier.citation | Thabethe, T.T., Adeojo, S.A., Mirzayeva, M.N. et al. 2022, 'The effects of 167 MeV Xe26+ swift heavy ions irradiation on chemical vapour deposited silicon carbide', Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 527, pp. 58-64, doi : 10.1016/j.nimb.2022.07.013. | en_US |
| dc.identifier.issn | 0168-583X (print) | |
| dc.identifier.issn | 1872-9584 (online) | |
| dc.identifier.other | 10.1016/j.nimb.2022.07.013 | |
| dc.identifier.uri | https://repository.up.ac.za/handle/2263/88968 | |
| dc.language.iso | en | en_US |
| dc.publisher | Elsevier | en_US |
| dc.rights | © 2022 Elsevier B.V. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 527, pp. 58-64, doi : 10.1016/j.nimb.2022.07.013. | en_US |
| dc.subject | X-ray diffraction (XRD) | en_US |
| dc.subject | Swift heavy ions (SHI) | en_US |
| dc.subject | Residual stress | en_US |
| dc.subject | Irradiation | en_US |
| dc.subject | Lattice | en_US |
| dc.title | The effects of 167 MeV Xe26+ swift heavy ions irradiation on chemical vapour deposited silicon carbide | en_US |
| dc.type | Postprint Article | en_US |
