dc.contributor.author |
Hlatshwayo, Thulani Thokozani
|
|
dc.contributor.author |
Mtshonisi, N.
|
|
dc.contributor.author |
Njoroge, Eric Gitau
|
|
dc.contributor.author |
Mlambo, Mbuso
|
|
dc.contributor.author |
Msimanga, M.
|
|
dc.contributor.author |
Skuratov, V.A.
|
|
dc.contributor.author |
O'Connell, J.H.
|
|
dc.contributor.author |
Malherbe, Johan B.
|
|
dc.contributor.author |
Motloung, Setumo Victor
|
|
dc.date.accessioned |
2021-09-01T06:46:46Z |
|
dc.date.available |
2021-09-01T06:46:46Z |
|
dc.date.issued |
2020-06 |
|
dc.description.abstract |
Please read abstract in the article. |
en_ZA |
dc.description.department |
Physics |
en_ZA |
dc.description.librarian |
hj2021 |
en_ZA |
dc.description.sponsorship |
National Research Foundation of South Africa, Knowledge Interchange and Collaboration Programme (KIC). |
en_ZA |
dc.description.uri |
http://www.elsevier.com/locate/nimb |
en_ZA |
dc.identifier.citation |
Hlatshwayo, T.T., Mtshonisi, N., Njoroge, E.G. et al. 2020, 'Effects of Ag and Sr dual ions implanted into SiC', Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 472, pp. 7-13. |
en_ZA |
dc.identifier.issn |
0168-583X (print) |
|
dc.identifier.issn |
1872-9584 (online) |
|
dc.identifier.other |
10.1016/j.nimb.2020.03.035 |
|
dc.identifier.uri |
http://hdl.handle.net/2263/81576 |
|
dc.language.iso |
en |
en_ZA |
dc.publisher |
Elsevier |
en_ZA |
dc.rights |
© 2020 Elsevier B.V. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 472, pp. 7-13, 2020. doi : 10.1016/j.nimb.2020.03.035. |
en_ZA |
dc.subject |
Silver (Ag) |
en_ZA |
dc.subject |
Strontium (Sr) |
en_ZA |
dc.subject |
Silicon carbide (SiC) |
en_ZA |
dc.subject |
Sr and implantation |
en_ZA |
dc.subject |
Raman spectroscopy |
en_ZA |
dc.subject |
Radiation damage |
en_ZA |
dc.subject |
Transmission electron microscopy (TEM) |
en_ZA |
dc.subject |
Elastic recoil detection analysis (ERDA) |
en_ZA |
dc.subject |
Rutherford backscattering spectrometry (RBS) |
en_ZA |
dc.subject |
Scanning electron microscopy (SEM) |
en_ZA |
dc.title |
Effects of Ag and Sr dual ions implanted into SiC |
en_ZA |
dc.type |
Postprint Article |
en_ZA |