Abstract:
Recently, researchers have attempted to increase the time efficiency of the smartphone DIN test by decreasing the number of presentations of the DIN. One suggestion was to use a variable step size based on the correctness of digits identified within the triplet. In contrast, another suggested using a fixed signal-to-noise ratio (SNR) presentation level for all presentations of the DIN test and producing a pass/fail result based on whether a 95% recognition level was reached. This study aimed to compare three novel DIN test procedures as a potential way to improve efficiency with acceptable reliability using smartphone technology.
