Defects in swift heavy ion irradiated n-4H-SiC

Tunhuma, Shandirai Malven; Diale, M. (Mmantsae Moche); Nel, Jacqueline Margot; Madito, M.J. (Moshawe); Hlatshwayo, Thulani Thokozani; Auret, Francois Danie

dc.contributor.author	Tunhuma, Shandirai Malven
dc.contributor.author	Diale, M. (Mmantsae Moche)
dc.contributor.author	Nel, Jacqueline Margot
dc.contributor.author	Madito, M.J. (Moshawe)
dc.contributor.author	Hlatshwayo, Thulani Thokozani
dc.contributor.author	Auret, Francois Danie
dc.date.accessioned	2020-07-28T08:49:41Z
dc.date.issued	2019-12
dc.description.abstract	Please read abstract in the article.	en_ZA
dc.description.department	Physics	en_ZA
dc.description.embargo	2020-12-01
dc.description.librarian	hj2020	en_ZA
dc.description.uri	http://www.elsevier.com/locate/nimb	en_ZA
dc.identifier.citation	Tunhuma, S.M., Diale, M., Nel, J.M. et al. 2019, 'Defects in swift heavy ion irradiated n-4H-SiC', Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 460, pp. 119-124.	en_ZA
dc.identifier.issn	0168-583X (print)
dc.identifier.issn	1872-9584 (online)
dc.identifier.other	10.1016/j.nimb.2018.11.046
dc.identifier.uri	http://hdl.handle.net/2263/75463
dc.language.iso	en	en_ZA
dc.publisher	Elsevier	en_ZA
dc.rights	© 2019 Elsevier B.V. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 460, pp. 119-124, 2019. doi : 10.1016/j.nimb.2018.11.046.	en_ZA
dc.subject	Deep level transient spectroscopy (DLTS)	en_ZA
dc.subject	Binary collision approximations	en_ZA
dc.subject	Raman spectroscopy	en_ZA
dc.subject	Atomic force microscopy (AFM)	en_ZA
dc.subject	Swift heavy ion (SHI)	en_ZA
dc.title	Defects in swift heavy ion irradiated n-4H-SiC	en_ZA
dc.type	Postprint Article	en_ZA