dc.contributor.author |
Abdelbagi, Hesham Abdelbagi Ali
|
|
dc.contributor.author |
Skuratov, Vladimir Alexeevich
|
|
dc.contributor.author |
Motloung, Setumo Victor
|
|
dc.contributor.author |
Njoroge, Eric Gitau
|
|
dc.contributor.author |
Mlambo, Mbuso
|
|
dc.contributor.author |
Malherbe, Johan B.
|
|
dc.contributor.author |
O'Connell, Jacques H.
|
|
dc.contributor.author |
Hlatshwayo, Thulani Thokozani
|
|
dc.date.accessioned |
2020-03-06T05:31:03Z |
|
dc.date.issued |
2019-12 |
|
dc.description.abstract |
Please read abstract in the article. |
en_ZA |
dc.description.department |
Physics |
en_ZA |
dc.description.embargo |
2020-12-15 |
|
dc.description.librarian |
hj2020 |
en_ZA |
dc.description.uri |
http://www.elsevier.com/locate/nimb |
en_ZA |
dc.identifier.citation |
Abdelbagi, H.A.A., Skuratov, V.A., Motloung, S.V. et al. 2019, 'Effect of swift heavy ions irradiation in the migration of silver implanted into polycrystalline SiC', Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 461, pp. 201-209. |
en_ZA |
dc.identifier.issn |
0168-583X (print) |
|
dc.identifier.issn |
1872-9584 (online) |
|
dc.identifier.other |
10.1016/j.nimb.2019.10.002 |
|
dc.identifier.uri |
http://hdl.handle.net/2263/73648 |
|
dc.language.iso |
en |
en_ZA |
dc.publisher |
Elsevier |
en_ZA |
dc.rights |
© 2019 Elsevier B.V. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 461, pp. 201-209, 2019. doi : 10.1016/j.nimb.2019.10.002. |
en_ZA |
dc.subject |
Swift heavy ion (SHI) |
en_ZA |
dc.subject |
Rutherford backscattering spectrometry (RBS) |
en_ZA |
dc.subject |
Structure |
en_ZA |
dc.subject |
SiC |
en_ZA |
dc.subject |
Scanning electron microscopy (SEM) |
en_ZA |
dc.subject |
Raman spectroscopy |
en_ZA |
dc.subject |
Transmission electron microscopy (TEM) |
en_ZA |
dc.title |
Effect of swift heavy ions irradiation in the migration of silver implanted into polycrystalline SiC |
en_ZA |
dc.type |
Postprint Article |
en_ZA |