In situ study of low-temperature irradiation-induced defects in silicon carbide

In situ study of low-temperature irradiation-induced defects in silicon carbide

Tunhuma, Shandirai Malven; Auret, Francois Danie; Danga, Helga Tariro; Nel, Jacqueline Margot; Diale, M. (Mmantsae Moche)
URI: http://hdl.handle.net/2263/73616
Date: 2019-06

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