Characterization of 167 MeV Xe ion irradiated n-type 4H-SiC

Characterization of 167 MeV Xe ion irradiated n-type 4H-SiC

Madito, Moshawe J.; Hlatshwayo, Thulani Thokozani; Skuratov, Vladimir A.; Mtshali, Christopher B.; Manyala, Ncholu I.; Khumalo, Zakhelumuzi M.
URI: http://hdl.handle.net/2263/71114
Date: 2019-11

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