Liu, Zhou; Mirhosseini, Seyed Sattar; Popov, Marjan; Audichya, Yash; Colangelo, Daniele; Jamali, Sadegh; Palensky, Peter; Hu, Weihao; Chen, Zhe
(Institute of Electrical and Electronics Engineers, 2020-09)
The application of multiterminal (MT), high-voltage dc (HVdc) (MTdc) grid technology requires test procedures for the operation and implementation of the protection solutions. The test procedures are usually derived from ...