dc.contributor.author |
Igumbor, Emmanuel
|
|
dc.contributor.author |
Olaniyan, Okikiola
|
|
dc.contributor.author |
Mapasha, Refilwe Edwin
|
|
dc.contributor.author |
Danga, Helga Tariro
|
|
dc.contributor.author |
Omotoso, Ezekiel
|
|
dc.contributor.author |
Meyer, Walter Ernst
|
|
dc.date.accessioned |
2018-05-08T11:06:22Z |
|
dc.date.issued |
2018-04 |
|
dc.description.abstract |
Please read abstract in the article. |
en_ZA |
dc.description.department |
Physics |
en_ZA |
dc.description.embargo |
2019-04-01 |
|
dc.description.librarian |
hj2018 |
en_ZA |
dc.description.sponsorship |
The National Research Foundation (NRF) of South Africa (Grant specific unique reference number (UID) 98961). |
en_ZA |
dc.description.uri |
http://iopscience.iop.org/journal/0953-8984 |
en_ZA |
dc.identifier.citation |
Igumbor, E., Olaniyan, O., Mapasha, R.E. et al 2018, 'Electrically active induced energy levels and metastability of B and N vacancy-complexes in 4H-SiC', Journal of Physics: Condensed Matter, vol. 30, no. 18, pp. 1-9. |
en_ZA |
dc.identifier.issn |
0953-8984 (print) |
|
dc.identifier.issn |
1361-648X (online) |
|
dc.identifier.other |
10.1088/1361-648X/aab819 |
|
dc.identifier.uri |
http://hdl.handle.net/2263/64786 |
|
dc.language.iso |
en |
en_ZA |
dc.publisher |
IOP Publishing |
en_ZA |
dc.rights |
© 2018 IOP Publishing Ltd. |
en_ZA |
dc.subject |
Ge |
en_ZA |
dc.subject |
Boron |
en_ZA |
dc.subject |
Defects |
en_ZA |
dc.subject |
Silicon |
en_ZA |
dc.subject |
Dielectric properties |
en_ZA |
dc.subject |
Ab Initio |
en_ZA |
dc.subject |
Augmented wave method |
en_ZA |
dc.subject |
Density functional theory (DFT) |
en_ZA |
dc.subject |
Complexes |
en_ZA |
dc.subject |
Charge state |
en_ZA |
dc.subject |
Formation energy |
en_ZA |
dc.title |
Electrically active induced energy levels and metastability of B and N vacancy-complexes in 4H-SiC |
en_ZA |
dc.type |
Postprint Article |
en_ZA |