The fine structure of electron irradiation induced EL2-like defects in n-GaAs

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dc.contributor.author Tunhuma, Shandirai Malven
dc.contributor.author Auret, Francois Danie
dc.contributor.author Legodi, Matshisa Johannes
dc.contributor.author Diale, M. (Mmantsae Moche)
dc.date.accessioned 2016-06-09T07:25:50Z
dc.date.available 2016-06-09T07:25:50Z
dc.date.issued 2016
dc.description.abstract Defects induced by electron irradiation in n-GaAs have been studied using deep level transient spectroscopy (DLTS) and Laplace DLTS (L-DLTS). The E0.83 (EL2) is the only defect observed prior to irradiation. Ru/n-GaAs Schottky diodes were irradiated with high energy electrons from a Sr-90 radionuclide up to a fluence of 2.45 1013 cm 2. The prominent electron irradiation induced defects, E0.04, E0.14, E0.38, and E0.63, were observed together with the metastable E0.17. Using L-DLTS, we observed the fine structure of a broad base EL2-like defect peak. This was found to be made up of the E0.75, E0.83, and E0.85 defects. Our study reveals that high energy electron irradiation increases the concentration of the E0.83 defect and introduces a family of defects with electronic properties similar to those of the EL2. en_ZA
dc.description.department Physics en_ZA
dc.description.librarian am2016 en_ZA
dc.description.sponsorship The authors gratefully acknowledge the financial support of the South African National Research Foundation (NRF) and the University of Pretoria. en_ZA
dc.description.sponsorship The South African National Research Foundation (NRF) and the University of Pretoria. en_ZA
dc.description.uri http://scitation.aip.org/content/aip/journal/jap en_ZA
dc.identifier.citation Tunhuma, SM, Auret, FD, Legodi, MJ & Diale, M 2015, 'The fine structure of electron irradiation induced EL2-like defects in n -GaAs', Journal of Applied Physics, vol. 119, no. 1, art. no. 145705, pp. 1-5. en_ZA
dc.identifier.issn 0021-8979 (print)
dc.identifier.issn 1089-7550 (online)
dc.identifier.other 10.1063/1.4945774
dc.identifier.uri http://hdl.handle.net/2263/52918
dc.language.iso en en_ZA
dc.publisher American Institute of Physics en_ZA
dc.rights © 2016 AIP Publishing LLC en_ZA
dc.subject Electron irradiation en_ZA
dc.subject n-GaAs en_ZA
dc.subject Defects en_ZA
dc.subject Deep level transient spectroscopy (DLTS) en_ZA
dc.subject Laplace deep level transient spectroscopy (L-DLTS) en_ZA
dc.title The fine structure of electron irradiation induced EL2-like defects in n-GaAs en_ZA
dc.type Article en_ZA


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