dc.contributor.author |
Golovins, Eugene
|
|
dc.contributor.author |
Sinha, Saurabh
|
|
dc.date.accessioned |
2013-04-17T14:02:43Z |
|
dc.date.available |
2013-04-17T14:02:43Z |
|
dc.date.issued |
2013-02 |
|
dc.description.abstract |
Embedded temperature sensors based on
proportional-to-the-absolute-temperature (PTAT) current
sources have the potential to lay the foundation for low-cost
temperature-aware integrated circuit architectures if they meet
the requirements of miniaturization, fabrication process match,
and precise estimation in a wide range of temperatures. This
paper addresses an analytical approach to the minimum-element
PTAT circuit design capitalizing on the physics-based modeling
of the heterojunction bipolar transistor (HBT) structures. It is
shown that a PTAT circuit can be implemented on only two
core HBT elements with good accuracy. Derived parametric
relations allow a straightforward specification of the thermal
gain at the design stage, which affects sensor sensitivity.
Further derived current-to-temperature mapping expresses a
temperature estimate based on the measured PTAT output
current. Numerical examples indicate attainable estimation
accuracy of 0.43% in case of a measurement instance taken in
the absence of measurement noise. |
en |
dc.description.librarian |
hb2013 |
en |
dc.description.librarian |
ai2013 |
en |
dc.description.sponsorship |
The National Research
Foundation of South Africa under Grant UID:74041 |
en |
dc.description.uri |
http://ieeexplore.ieee.org/ |
en |
dc.identifier.citation |
Golovins, E & Sinha, S 2013, 'Analytical approach to design of proportional-to-the-absolute-temperature current sources and temperature sensors based on heterojunction bipolar transistors', IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 3, no. 2, pp. 262-274. |
en |
dc.identifier.issn |
2156-3985 (online) |
|
dc.identifier.issn |
2156-3950 (print) |
|
dc.identifier.other |
10.1109/TCPMT.2012.2226886 |
|
dc.identifier.uri |
http://hdl.handle.net/2263/21300 |
|
dc.language.iso |
en |
en |
dc.publisher |
Institute of Electrical and Electronics Engineers |
en |
dc.rights |
© 2012 IEEE |
en |
dc.subject |
(BiCMOS) integrated circuits |
en |
dc.subject |
Bi-complementary metal–oxide |
en |
dc.subject |
Heterojunction bipolar transistor (HBT) |
en |
dc.subject.lcsh |
Heterojunctions |
en |
dc.subject.lcsh |
Temperature measurements |
en |
dc.subject.lcsh |
Bipolar integrated circuits -- Thermal properties |
en |
dc.subject.lcsh |
Detectors |
en |
dc.subject.lcsh |
Metal oxide semiconductors, Complementary |
en |
dc.subject.lcsh |
Bipolar transistors |
en |
dc.title |
Analytical approach to design of proportional-to-the-absolute-temperature current sources and temperature sensors based on heterojunction bipolar transistors |
en |
dc.type |
Postprint Article |
en |