dc.contributor.author |
Chawanda, Albert
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dc.contributor.author |
Mtangi, Wilbert
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dc.contributor.author |
Auret, Francois Danie
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dc.contributor.author |
Nel, Jacqueline Margot
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dc.contributor.author |
Nyamhere, Cloud
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dc.contributor.author |
Diale, M. (Mmantsae Moche)
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dc.date.accessioned |
2012-06-12T06:10:18Z |
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dc.date.available |
2012-06-12T06:10:18Z |
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dc.date.issued |
2012-05 |
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dc.description.abstract |
The variation in electrical characteristics of Au/n-Ge (1 0 0) Schottky contacts have been systematically investigated as a function of temperature using current-voltage (I-V) measurements in the temperature range 140-300 K. The I-V characteristics of the diodes indicate very strong temperature dependence. While the ideality factor n decreases, the zero-bias Schottky barrier height (SBH) ( ɸʙ) increases with the increasing temperature. The I-V characteristics are analysed using the thermionic emission (TE) model and the assumption of a Gaussian distribution of the barrier heights ɸʙ vs. ½ kT plot has been used to show the evidence of a Gaussian distribution of barrier heights and values of ɸʙ = 0.615 eV and standard deviation σs0 = 0.00858 eV for the mean barrier height and zero-bias standard deviation have been obtained from this plot, respectively. The Richardson constant and the mean barrier height from the modified Richardson plot were obtained as 1.37 A cm-2 K-2 and 0.639 eV, respectively. This Richardson constant is much smaller than the reported of 50 A cm-2 K-2. This may be due to greater inhomogeneities at the interface. |
en |
dc.description.librarian |
nf2012 |
en |
dc.description.sponsorship |
The South African National Research Foundation |
en_US |
dc.description.uri |
http://www.elsevier.com/locate/physb |
en_US |
dc.identifier.citation |
Albert Chawanda, Wilbert Mtangi, Francois D. Auret, Jacqueline Nel, Cloud Nyamhere & Mmantsae Diale, Current-voltage temperature characteristics of Au/n-Ge (1 0 0) Schottky diodes, Physica B, Vol. 407, no. 10, pp. 1574-1577 (2012), doi: 10.1016/j.physb.2011.09.089 |
en |
dc.identifier.issn |
0921-4526 (print) |
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dc.identifier.issn |
1873-2135 (online) |
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dc.identifier.other |
10.1016/j.physb.2011.09.089 |
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dc.identifier.uri |
http://hdl.handle.net/2263/19145 |
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dc.language.iso |
en |
en_US |
dc.publisher |
Elsevier |
en_US |
dc.rights |
© 2011 Elsevier B.V. All rights reserved. |
en_US |
dc.subject |
Schottky contacts |
en |
dc.subject |
Current–voltage–temperature |
en |
dc.subject |
Schottky barrierheight |
en |
dc.subject |
Schottky diodes |
en |
dc.subject.lcsh |
Gaussian distribution |
en |
dc.subject.lcsh |
Inhomogeneous materials |
en |
dc.title |
Current-voltage temperature characteristics of Au/n-Ge (1 0 0) Schottky diodes |
en |
dc.type |
Postprint Article |
en |