dc.contributor.author |
Ngoepe, Phuti Ngako Mahloka
|
|
dc.contributor.author |
Meyer, Walter Ernst
|
|
dc.contributor.author |
Diale, M. (Mmantsae Moche)
|
|
dc.contributor.author |
Auret, Francois Danie
|
|
dc.contributor.author |
Van Schalkwyk, Louwrens
|
|
dc.date.accessioned |
2012-06-12T06:09:34Z |
|
dc.date.available |
2012-06-12T06:09:34Z |
|
dc.date.issued |
2012-06 |
|
dc.description.abstract |
Please read abstract in the article. |
en_US |
dc.description.librarian |
nf2012 |
en |
dc.description.uri |
http://www.elsevier.com/locate/physb |
en_US |
dc.identifier.citation |
P.N.M. Ngoepe, W.E. Meyer, M. Diale, F.D. Auret, L.van Schalkwyk, Optoelectronic characterization of Au/Ni/n-AIGaN photodiodes after annealing at different temperatures, Physica B, vol. 407, no. 10, pp. 1628-1630 (2012), doi: 10.1016/j.physb.2011.09.102 |
en |
dc.identifier.issn |
0921-4526 (print) |
|
dc.identifier.issn |
1873-2135 (online) |
|
dc.identifier.other |
10.1016/j.physb.2011.09.102 |
|
dc.identifier.uri |
http://hdl.handle.net/2263/19144 |
|
dc.language.iso |
en |
en_US |
dc.publisher |
Elsevier |
en_US |
dc.rights |
© 2011 Elsevier B.V. All rights reserved. |
en_US |
dc.subject |
Annealing |
en |
dc.subject |
Schottky photodiodes |
en |
dc.subject |
AlGaN |
en |
dc.subject.lcsh |
Photodiodes |
en |
dc.subject.lcsh |
Optoelectronics |
en |
dc.title |
Optoelectronic characterization of Au/Ni/n-AIGaN photodiodes after annealing at different temperatures |
en |
dc.type |
Postprint Article |
en |