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Browsing UP Experts (Danie Auret Collection) by Subject "Annealing of metals"
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Electrical characterization of defects introduced during metallization processes in n-type germanium (Elsevier, 2009)We have studied the defects introduced in n-type Ge during electron beam deposition (EBD) and sputter deposition (SD) by deep-level transient spectroscopy (DLTS) and evaluated their infleunce on the rectification quality ...
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