Omotoso, Ezekiel; Meyer, Walter Ernst; Auret, Francois Danie; Paradzah, Alexander Tapera; Diale, M. (Mmantsae Moche); Coelho, Sergio M.M.; Janse van Rensburg, Pieter Johan; Ngoepe, Phuti Ngako Mahloka
(Elsevier, 2015-12)
Current–voltage, capacitance–voltage and conventional deep level transient spectroscopy at temperature
ranges from 40 to 300 K have been employed to study the influence of alpha-particle irradiation from an
241Am source ...