dc.contributor.author |
Coetsee, Theresa
|
|
dc.contributor.author |
De Bruin, Frederik
|
|
dc.date.accessioned |
2025-03-10T07:20:27Z |
|
dc.date.available |
2025-03-10T07:20:27Z |
|
dc.date.issued |
2025-03 |
|
dc.description |
DATA AVAILABILITY : Data will be made available on request. |
en_US |
dc.description.abstract |
Please read abstract in the article. |
en_US |
dc.description.department |
Materials Science and Metallurgical Engineering |
en_US |
dc.description.librarian |
hj2024 |
en_US |
dc.description.sdg |
SDG-09: Industry, innovation and infrastructure |
en_US |
dc.description.sponsorship |
The University of Pretoria. |
en_US |
dc.description.uri |
https://www.elsevier.com/locate/ctta |
en_US |
dc.identifier.citation |
Coetsee, T. & De Bruin, F.J. 2025, 'Thermochemical analysis of the behaviour of Cu in Ti nano-strand formation from low-temperature reaction of Al-Fe-Cu powder with CaF2-SiO2-Al2O3-MgO-MnO-TiO2 flux', Chemical Thermodynamics and Thermal Analysis, vol. 17, art. 100160, pp. 1-10, doi : 10.1016/j.ctta.2024.100160. |
en_US |
dc.identifier.issn |
2667-3126 (online) |
|
dc.identifier.other |
10.1016/j.ctta.2024.100160 |
|
dc.identifier.uri |
http://hdl.handle.net/2263/101403 |
|
dc.language.iso |
en |
en_US |
dc.publisher |
Elsevier |
en_US |
dc.rights |
© 2024 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-
nc-nd/4.0/). |
en_US |
dc.subject |
Submerged arc welding (SAW) |
en_US |
dc.subject |
Fluoride |
en_US |
dc.subject |
Slag |
en_US |
dc.subject |
Gas |
en_US |
dc.subject |
Oxy-fluoride |
en_US |
dc.subject |
Thermochemistry |
en_US |
dc.subject |
Nano |
en_US |
dc.subject |
Energy dispersive X-ray spectroscopy (EDX) |
en_US |
dc.subject |
SDG-09: Industry, innovation and infrastructure |
en_US |
dc.title |
Thermochemical analysis of the behaviour of Cu in Ti nano-strand formation from low-temperature reaction of Al-Fe-Cu powder with CaF2-SiO2-Al2O3-MgO-MnO-TiO2 flux |
en_US |
dc.type |
Article |
en_US |